Fabrication, thermal stability and reflectivity measurements of Mo/Si-multilayers as X-ray mirrors and other optical components

Kloidt A, Stock HJ, Kleineberg U, Döhring T, Pröpper M, Nolting K, Heidemann B, Tappe T, Schmiedeskamp B, Heinzmann U, Krumrey M, et al. (1992)
Spie Proc. 1992 (Soc. Phot. Opt. Instr. Eng.) 1742: 593.

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Zeitschriftenaufsatz | Veröffentlicht | Englisch
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Spie Proc. 1992 (Soc. Phot. Opt. Instr. Eng.)
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1742
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593
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Kloidt A, Stock HJ, Kleineberg U, et al. Fabrication, thermal stability and reflectivity measurements of Mo/Si-multilayers as X-ray mirrors and other optical components. Spie Proc. 1992 (Soc. Phot. Opt. Instr. Eng.). 1992;1742:593.
Kloidt, A., Stock, H. J., Kleineberg, U., Döhring, T., Pröpper, M., Nolting, K., Heidemann, B., et al. (1992). Fabrication, thermal stability and reflectivity measurements of Mo/Si-multilayers as X-ray mirrors and other optical components. Spie Proc. 1992 (Soc. Phot. Opt. Instr. Eng.), 1742, 593.
Kloidt, A., Stock, H. J., Kleineberg, U., Döhring, T., Pröpper, M., Nolting, K., Heidemann, B., Tappe, T., Schmiedeskamp, B., Heinzmann, U., et al. (1992). Fabrication, thermal stability and reflectivity measurements of Mo/Si-multilayers as X-ray mirrors and other optical components. Spie Proc. 1992 (Soc. Phot. Opt. Instr. Eng.) 1742, 593.
Kloidt, A., et al., 1992. Fabrication, thermal stability and reflectivity measurements of Mo/Si-multilayers as X-ray mirrors and other optical components. Spie Proc. 1992 (Soc. Phot. Opt. Instr. Eng.), 1742, p 593.
A. Kloidt, et al., “Fabrication, thermal stability and reflectivity measurements of Mo/Si-multilayers as X-ray mirrors and other optical components”, Spie Proc. 1992 (Soc. Phot. Opt. Instr. Eng.), vol. 1742, 1992, pp. 593.
Kloidt, A., Stock, H.J., Kleineberg, U., Döhring, T., Pröpper, M., Nolting, K., Heidemann, B., Tappe, T., Schmiedeskamp, B., Heinzmann, U., Krumrey, M., Müller, P., Scholze, F., Rahn, S., Hormes, J., Heidemann, K.F.: Fabrication, thermal stability and reflectivity measurements of Mo/Si-multilayers as X-ray mirrors and other optical components. Spie Proc. 1992 (Soc. Phot. Opt. Instr. Eng.). 1742, 593 (1992).
Kloidt, A., Stock, H.J., Kleineberg, U., Döhring, T., Pröpper, M., Nolting, K., Heidemann, B., Tappe, T., Schmiedeskamp, B., Heinzmann, Ulrich, Krumrey, M., Müller, P., Scholze, F., Rahn, S., Hormes, J., and Heidemann, K.F. “Fabrication, thermal stability and reflectivity measurements of Mo/Si-multilayers as X-ray mirrors and other optical components”. Spie Proc. 1992 (Soc. Phot. Opt. Instr. Eng.) 1742 (1992): 593.

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