Low energy electron point source microscopy: beyond imaging

Beyer A, Gölzhäuser A (2010)
J. of Physics: Condensed Matter 22(34).

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Beyer A, Gölzhäuser A. Low energy electron point source microscopy: beyond imaging. J. of Physics: Condensed Matter. 2010;22(34).
Beyer, A., & Gölzhäuser, A. (2010). Low energy electron point source microscopy: beyond imaging. J. of Physics: Condensed Matter, 22(34).
Beyer, A., and Gölzhäuser, A. (2010). Low energy electron point source microscopy: beyond imaging. J. of Physics: Condensed Matter 22.
Beyer, A., & Gölzhäuser, A., 2010. Low energy electron point source microscopy: beyond imaging. J. of Physics: Condensed Matter, 22(34).
A. Beyer and A. Gölzhäuser, “Low energy electron point source microscopy: beyond imaging”, J. of Physics: Condensed Matter, vol. 22, 2010.
Beyer, A., Gölzhäuser, A.: Low energy electron point source microscopy: beyond imaging. J. of Physics: Condensed Matter. 22, (2010).
Beyer, André, and Gölzhäuser, Armin. “Low energy electron point source microscopy: beyond imaging”. J. of Physics: Condensed Matter 22.34 (2010).
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