Characterization of nanowires with the low energy electron point source (LEEPS) microscope

Beyer A, Weber DH, Völkel B, Gölzhäuser A (2010)
Physica Satus Solidi B 247(10): 2550-2556.

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Beyer A, Weber DH, Völkel B, Gölzhäuser A. Characterization of nanowires with the low energy electron point source (LEEPS) microscope. Physica Satus Solidi B. 2010;247(10):2550-2556.
Beyer, A., Weber, D. H., Völkel, B., & Gölzhäuser, A. (2010). Characterization of nanowires with the low energy electron point source (LEEPS) microscope. Physica Satus Solidi B, 247(10), 2550-2556.
Beyer, A., Weber, D. H., Völkel, B., and Gölzhäuser, A. (2010). Characterization of nanowires with the low energy electron point source (LEEPS) microscope. Physica Satus Solidi B 247, 2550-2556.
Beyer, A., et al., 2010. Characterization of nanowires with the low energy electron point source (LEEPS) microscope. Physica Satus Solidi B, 247(10), p 2550-2556.
A. Beyer, et al., “Characterization of nanowires with the low energy electron point source (LEEPS) microscope”, Physica Satus Solidi B, vol. 247, 2010, pp. 2550-2556.
Beyer, A., Weber, D.H., Völkel, B., Gölzhäuser, A.: Characterization of nanowires with the low energy electron point source (LEEPS) microscope. Physica Satus Solidi B. 247, 2550-2556 (2010).
Beyer, André, Weber, Dirk Henning, Völkel, Berthold, and Gölzhäuser, Armin. “Characterization of nanowires with the low energy electron point source (LEEPS) microscope”. Physica Satus Solidi B 247.10 (2010): 2550-2556.
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