Integration of Regions and Contours for Object Recognition

Schlüter D, Posch S, Kummert F, Sagerer G (2000)
In: Proc. 15th International Conference on Pattern Recognition. Barcelona, IEEE: 944-947.

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We present an integrated approach combining region and contour-based techniques to enhance both segmentation and recognition processes. This cue integration operates on the level of contour-based groups and complete regions, which are matched to reflect a common cause in the image (and thus in the scene). Additionally, we realize a top-down scheme controlling the segmentation process on the basis of unresolvable image areas and the integration of processes on different time scales using a region memory. Results for real images are given showing distinct improvements of recognition results.
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Schlüter D, Posch S, Kummert F, Sagerer G. Integration of Regions and Contours for Object Recognition. In: Proc. 15th International Conference on Pattern Recognition. Barcelona, IEEE; 2000: 944-947.
Schlüter, D., Posch, S., Kummert, F., & Sagerer, G. (2000). Integration of Regions and Contours for Object Recognition. Proc. 15th International Conference on Pattern Recognition, 944-947.
Schlüter, D., Posch, S., Kummert, F., and Sagerer, G. (2000). “Integration of Regions and Contours for Object Recognition” in Proc. 15th International Conference on Pattern Recognition (Barcelona, IEEE), 944-947.
Schlüter, D., et al., 2000. Integration of Regions and Contours for Object Recognition. In Proc. 15th International Conference on Pattern Recognition. Barcelona, IEEE, pp. 944-947.
D. Schlüter, et al., “Integration of Regions and Contours for Object Recognition”, Proc. 15th International Conference on Pattern Recognition, Barcelona, IEEE: 2000, pp.944-947.
Schlüter, D., Posch, S., Kummert, F., Sagerer, G.: Integration of Regions and Contours for Object Recognition. Proc. 15th International Conference on Pattern Recognition. p. 944-947. Barcelona, IEEE (2000).
Schlüter, Daniel, Posch, Stefan, Kummert, Franz, and Sagerer, Gerhard. “Integration of Regions and Contours for Object Recognition”. Proc. 15th International Conference on Pattern Recognition. Barcelona, IEEE, 2000. 944-947.
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