Characterization of DMPC bilayers and multilamellar islands on hydrophobic self-assembled monolayers of ODS/Si (100) and mixed ODS-DDS/Si (100)

Brechling A, Sundermann M, Kleineberg U, Heinzmann U (2003)
Thin Solid Films 433(1-2): 281-286.

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Brechling A, Sundermann M, Kleineberg U, Heinzmann U. Characterization of DMPC bilayers and multilamellar islands on hydrophobic self-assembled monolayers of ODS/Si (100) and mixed ODS-DDS/Si (100). Thin Solid Films. 2003;433(1-2):281-286.
Brechling, A., Sundermann, M., Kleineberg, U., & Heinzmann, U. (2003). Characterization of DMPC bilayers and multilamellar islands on hydrophobic self-assembled monolayers of ODS/Si (100) and mixed ODS-DDS/Si (100). Thin Solid Films, 433(1-2), 281-286. doi:10.1016/S0040-6090(03)00351-1
Brechling, A., Sundermann, M., Kleineberg, U., and Heinzmann, U. (2003). Characterization of DMPC bilayers and multilamellar islands on hydrophobic self-assembled monolayers of ODS/Si (100) and mixed ODS-DDS/Si (100). Thin Solid Films 433, 281-286.
Brechling, A., et al., 2003. Characterization of DMPC bilayers and multilamellar islands on hydrophobic self-assembled monolayers of ODS/Si (100) and mixed ODS-DDS/Si (100). Thin Solid Films, 433(1-2), p 281-286.
A. Brechling, et al., “Characterization of DMPC bilayers and multilamellar islands on hydrophobic self-assembled monolayers of ODS/Si (100) and mixed ODS-DDS/Si (100)”, Thin Solid Films, vol. 433, 2003, pp. 281-286.
Brechling, A., Sundermann, M., Kleineberg, U., Heinzmann, U.: Characterization of DMPC bilayers and multilamellar islands on hydrophobic self-assembled monolayers of ODS/Si (100) and mixed ODS-DDS/Si (100). Thin Solid Films. 433, 281-286 (2003).
Brechling, Armin, Sundermann, M., Kleineberg, U., and Heinzmann, Ulrich. “Characterization of DMPC bilayers and multilamellar islands on hydrophobic self-assembled monolayers of ODS/Si (100) and mixed ODS-DDS/Si (100)”. Thin Solid Films 433.1-2 (2003): 281-286.
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