Aperiodic nanometer multilayer systems as optical key components for attosecond electron spectroscopy

Wonisch A, Westerwalbesloh T, Kabachnik N, Kleineberg U, Hachmann W, Heinzmann U, Kabachnik N (2004)
Thin Solid Films 464-465 464-465: 473-477.

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Wonisch A, Westerwalbesloh T, Kabachnik N, et al. Aperiodic nanometer multilayer systems as optical key components for attosecond electron spectroscopy. Thin Solid Films 464-465. 2004;464-465:473-477.
Wonisch, A., Westerwalbesloh, T., Kabachnik, N., Kleineberg, U., Hachmann, W., Heinzmann, U., & Kabachnik, N. (2004). Aperiodic nanometer multilayer systems as optical key components for attosecond electron spectroscopy. Thin Solid Films 464-465, 464-465, 473-477.
Wonisch, A., Westerwalbesloh, T., Kabachnik, N., Kleineberg, U., Hachmann, W., Heinzmann, U., and Kabachnik, N. (2004). Aperiodic nanometer multilayer systems as optical key components for attosecond electron spectroscopy. Thin Solid Films 464-465 464-465, 473-477.
Wonisch, A., et al., 2004. Aperiodic nanometer multilayer systems as optical key components for attosecond electron spectroscopy. Thin Solid Films 464-465, 464-465, p 473-477.
A. Wonisch, et al., “Aperiodic nanometer multilayer systems as optical key components for attosecond electron spectroscopy”, Thin Solid Films 464-465, vol. 464-465, 2004, pp. 473-477.
Wonisch, A., Westerwalbesloh, T., Kabachnik, N., Kleineberg, U., Hachmann, W., Heinzmann, U., Kabachnik, N.: Aperiodic nanometer multilayer systems as optical key components for attosecond electron spectroscopy. Thin Solid Films 464-465. 464-465, 473-477 (2004).
Wonisch, Andreas, Westerwalbesloh, Thomas, Kabachnik, Nicolei, Kleineberg, Ulf, Hachmann, Wiebke, Heinzmann, Ulrich, and Kabachnik, Nikolay. “Aperiodic nanometer multilayer systems as optical key components for attosecond electron spectroscopy”. Thin Solid Films 464-465 464-465 (2004): 473-477.
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