Thickness-dependent effects in the work function of polycrystalline Cu-Films

Vancea J, Reiss G, Butz D, Hoffmann H (1989)
Europhysics letters 9(4): 379-384.

Download
OA
Journal Article | Published | English
Author
; ; ;
Abstract
Ideal metallic films are expected to show a thickness-dependent work function at a level of 0.1 eV in a short thickness range (5 nm). We investigated the variation of the work function with film thickness during the evaporation of polycrystalline Cu films on glass and Ni substrates, using the vibrating capacitor (Kelvin-)method. An increase of the work function with increasing film thickness at 0.1 eV level has been observed at the vacuum-metal interface according to the theoretical expectations. The effect, however, ranges over large thicknesses ((10 ÷ 15) nm), i.e. comparable with electronic scattering lengths in metal films. This behaviour can be attributed to the violation of local charge neutrality in films with unlike surfaces.
Publishing Year
ISSN
eISSN
PUB-ID

Cite this

Vancea J, Reiss G, Butz D, Hoffmann H. Thickness-dependent effects in the work function of polycrystalline Cu-Films. Europhysics letters. 1989;9(4):379-384.
Vancea, J., Reiss, G., Butz, D., & Hoffmann, H. (1989). Thickness-dependent effects in the work function of polycrystalline Cu-Films. Europhysics letters, 9(4), 379-384.
Vancea, J., Reiss, G., Butz, D., and Hoffmann, H. (1989). Thickness-dependent effects in the work function of polycrystalline Cu-Films. Europhysics letters 9, 379-384.
Vancea, J., et al., 1989. Thickness-dependent effects in the work function of polycrystalline Cu-Films. Europhysics letters, 9(4), p 379-384.
J. Vancea, et al., “Thickness-dependent effects in the work function of polycrystalline Cu-Films”, Europhysics letters, vol. 9, 1989, pp. 379-384.
Vancea, J., Reiss, G., Butz, D., Hoffmann, H.: Thickness-dependent effects in the work function of polycrystalline Cu-Films. Europhysics letters. 9, 379-384 (1989).
Vancea, Johann, Reiss, Günter, Butz, D., and Hoffmann, Horst. “Thickness-dependent effects in the work function of polycrystalline Cu-Films”. Europhysics letters 9.4 (1989): 379-384.
Main File(s)
File Name
Access Level
OA Open Access

This data publication is cited in the following publications:
This publication cites the following data publications:

Export

0 Marked Publications

Open Data PUB

Web of Science

View record in Web of Science®

Search this title in

Google Scholar