Mean-free-path concept in polycrystalline metals

Vancea J, Reiss G, Hoffmann H (1986)
Physical Review , B 35(12): 6435-6437.

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Abstract / Bemerkung
A crude analysis of the observed thickness dependence of the conductivity in fine-grained metals shows a very weak connection with the resistivity caused by grain-boundary scattering. An "effective intrinsic mean free path" for the whole polycrystal, as introduced in the well-known theory of Mayadas and Shatzkes, cannot explain the observed size effect. It is impossible to define a mean free path for the whole polycrystal, especially if the resistivity is governed by grain-boundary scattering.
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Zeitschriftentitel
Physical Review , B
Band
35
Zeitschriftennummer
12
Seite
6435-6437
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Vancea J, Reiss G, Hoffmann H. Mean-free-path concept in polycrystalline metals. Physical Review , B. 1986;35(12):6435-6437.
Vancea, J., Reiss, G., & Hoffmann, H. (1986). Mean-free-path concept in polycrystalline metals. Physical Review , B, 35(12), 6435-6437. doi:10.1103/PhysRevB.35.6435
Vancea, J., Reiss, G., and Hoffmann, H. (1986). Mean-free-path concept in polycrystalline metals. Physical Review , B 35, 6435-6437.
Vancea, J., Reiss, G., & Hoffmann, H., 1986. Mean-free-path concept in polycrystalline metals. Physical Review , B, 35(12), p 6435-6437.
J. Vancea, G. Reiss, and H. Hoffmann, “Mean-free-path concept in polycrystalline metals”, Physical Review , B, vol. 35, 1986, pp. 6435-6437.
Vancea, J., Reiss, G., Hoffmann, H.: Mean-free-path concept in polycrystalline metals. Physical Review , B. 35, 6435-6437 (1986).
Vancea, Johann, Reiss, Günter, and Hoffmann, Horst. “Mean-free-path concept in polycrystalline metals”. Physical Review , B 35.12 (1986): 6435-6437.
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5 Zitationen in Europe PMC

Daten bereitgestellt von Europe PubMed Central.

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Electrically tunable resistance of a metal.
Sagmeister M, Brossmann U, Landgraf S, Würschum R., Phys Rev Lett 96(15), 2006
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Electronic transport properties of giant-magnetoresistance Fe/Cr multilayers.
Jacob M, Reiss G, Brückl H, Hoffmann H., Phys Rev B Condens Matter 46(17), 1992
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Thickness-dependent thin-film resistivity: Application of quantitative scanning-tunneling-microscopy imaging.
Reiss G, Hastreiter E, Brückl H, Vancea J., Phys Rev B Condens Matter 43(6), 1991
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Jacob U, Vancea J, Hoffmann H., Phys Rev B Condens Matter 41(17), 1990
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14 References

Daten bereitgestellt von Europe PubMed Central.


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