Electronic transport properties and thickness dependence of the giant magnetoresistance in Co/Cu multilayers

Eckl T, Reiss G, Brückl H, Hoffmann H (1994)
Journal of applied physics 75(1): 362-367.

Download
OA
Zeitschriftenaufsatz | Veröffentlicht | Englisch
Autor
; ; ;
Abstract / Bemerkung
The transport properties of electrons in Co/Cu multilayered thin films are of special interest for the giant magnetoresistance (GMR) of this system. The magnitude of this effect depends on the mean free paths and on the strength of the interface scattering which in turn are strongly related to film structure. In this article, we discuss the results of resistance and magnetoresistance measurements carried out during film growth. We characterize the electronic transport parameters of these films and the growth mechanism of the layers. The new technique of the in situ measurement of the magnetoresistance furthermore provides a tool to find correlations of the growth mechanism with the dependence of the GMR on the Co thickness.
Erscheinungsjahr
Zeitschriftentitel
Journal of applied physics
Band
75
Zeitschriftennummer
1
Seite
362-367
ISSN
PUB-ID

Zitieren

Eckl T, Reiss G, Brückl H, Hoffmann H. Electronic transport properties and thickness dependence of the giant magnetoresistance in Co/Cu multilayers. Journal of applied physics. 1994;75(1):362-367.
Eckl, T., Reiss, G., Brückl, H., & Hoffmann, H. (1994). Electronic transport properties and thickness dependence of the giant magnetoresistance in Co/Cu multilayers. Journal of applied physics, 75(1), 362-367. doi:10.1063/1.355859
Eckl, T., Reiss, G., Brückl, H., and Hoffmann, H. (1994). Electronic transport properties and thickness dependence of the giant magnetoresistance in Co/Cu multilayers. Journal of applied physics 75, 362-367.
Eckl, T., et al., 1994. Electronic transport properties and thickness dependence of the giant magnetoresistance in Co/Cu multilayers. Journal of applied physics, 75(1), p 362-367.
T. Eckl, et al., “Electronic transport properties and thickness dependence of the giant magnetoresistance in Co/Cu multilayers”, Journal of applied physics, vol. 75, 1994, pp. 362-367.
Eckl, T., Reiss, G., Brückl, H., Hoffmann, H.: Electronic transport properties and thickness dependence of the giant magnetoresistance in Co/Cu multilayers. Journal of applied physics. 75, 362-367 (1994).
Eckl, Th., Reiss, Günter, Brückl, Hubert, and Hoffmann, Horst. “Electronic transport properties and thickness dependence of the giant magnetoresistance in Co/Cu multilayers”. Journal of applied physics 75.1 (1994): 362-367.
Alle Dateien verfügbar unter der/den folgenden Lizenz(en):
Copyright Statement:
This Item is protected by copyright and/or related rights. [...]
Volltext(e)
Access Level
OA Open Access
Zuletzt Hochgeladen
2017-10-27T14:20:07Z