STM on polycrystalline thin films

Reiss G (1990)
Vacuum 41(4-6): 1322-1324.

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Zeitschriftenaufsatz | Veröffentlicht | Englisch
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Abstract / Bemerkung
Examples for correlations of results of Scanning Tunnelling Microscopy (STM) with thickness dependent physical properties of thin films will be discussed: surface roughness enhances the thickness dependent resistivity. This effect can be described quantitatively by STM imaging. Good agreement with a simple model of the film resistivity can be found for Au and Cr-Au films. The magnetization loops of Au-Fe-Au films depend on the preparation parameters, although RHEED indicates identical flat surfaces. STM, however, often shows different local topographies. Again a direct correlation can be established.
Erscheinungsjahr
Zeitschriftentitel
Vacuum
Band
41
Zeitschriftennummer
4-6
Seite
1322-1324
ISSN
PUB-ID

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Reiss G. STM on polycrystalline thin films. Vacuum. 1990;41(4-6):1322-1324.
Reiss, G. (1990). STM on polycrystalline thin films. Vacuum, 41(4-6), 1322-1324. doi:10.1016/0042-207X(90)93946-G
Reiss, G. (1990). STM on polycrystalline thin films. Vacuum 41, 1322-1324.
Reiss, G., 1990. STM on polycrystalline thin films. Vacuum, 41(4-6), p 1322-1324.
G. Reiss, “STM on polycrystalline thin films”, Vacuum, vol. 41, 1990, pp. 1322-1324.
Reiss, G.: STM on polycrystalline thin films. Vacuum. 41, 1322-1324 (1990).
Reiss, Günter. “STM on polycrystalline thin films”. Vacuum 41.4-6 (1990): 1322-1324.
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2017-02-21T11:41:51Z