STRUCTURE INVESTIGATIONS OF XE-ADSORBATE LAYERS BY SPIN-POLARIZED LOW-ENERGY-ELECTRON DIFFRACTION .2. (ROOT-3X-ROOT-3)R30-DEGREES-XE PD(111) AND THE DILUTE PHASE OF XE PD(111)

HILGERS G, POTTHOFF M, Müller N, Heinzmann U (1995)
SURFACE SCIENCE 322(1-3): 207-220.

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Abstract
The adsorbate systems (root 3 x root 3)R30 degrees-Xe/Pd(111) and the 'dilute' phase of Xe/Pd(111) were investigated with spin-polarized low-energy electron diffraction (SPLEED). Spin-polarized electrons from a GaAs source were scattered and the spin-dependent intensities were measured. Comparative calculations were carried out by means of a relativistic LEED program. The structure determination of (root 3 x root 3)R30 degrees-Xe/Pd(111) yields a layer distance of 3.5+/-0.1 Angstrom, the Xe atoms being adsorbed in hollow sites. In the 'dilute' phase of Xe/Pd(111) the adsorbed Xe atoms occupy on-top sites with a Xe-Pd distance of 4.0+/-0.1 Angstrom without two-dimensional periodicity.
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HILGERS G, POTTHOFF M, Müller N, Heinzmann U. STRUCTURE INVESTIGATIONS OF XE-ADSORBATE LAYERS BY SPIN-POLARIZED LOW-ENERGY-ELECTRON DIFFRACTION .2. (ROOT-3X-ROOT-3)R30-DEGREES-XE PD(111) AND THE DILUTE PHASE OF XE PD(111). SURFACE SCIENCE. 1995;322(1-3):207-220.
HILGERS, G., POTTHOFF, M., Müller, N., & Heinzmann, U. (1995). STRUCTURE INVESTIGATIONS OF XE-ADSORBATE LAYERS BY SPIN-POLARIZED LOW-ENERGY-ELECTRON DIFFRACTION .2. (ROOT-3X-ROOT-3)R30-DEGREES-XE PD(111) AND THE DILUTE PHASE OF XE PD(111). SURFACE SCIENCE, 322(1-3), 207-220.
HILGERS, G., POTTHOFF, M., Müller, N., and Heinzmann, U. (1995). STRUCTURE INVESTIGATIONS OF XE-ADSORBATE LAYERS BY SPIN-POLARIZED LOW-ENERGY-ELECTRON DIFFRACTION .2. (ROOT-3X-ROOT-3)R30-DEGREES-XE PD(111) AND THE DILUTE PHASE OF XE PD(111). SURFACE SCIENCE 322, 207-220.
HILGERS, G., et al., 1995. STRUCTURE INVESTIGATIONS OF XE-ADSORBATE LAYERS BY SPIN-POLARIZED LOW-ENERGY-ELECTRON DIFFRACTION .2. (ROOT-3X-ROOT-3)R30-DEGREES-XE PD(111) AND THE DILUTE PHASE OF XE PD(111). SURFACE SCIENCE, 322(1-3), p 207-220.
G. HILGERS, et al., “STRUCTURE INVESTIGATIONS OF XE-ADSORBATE LAYERS BY SPIN-POLARIZED LOW-ENERGY-ELECTRON DIFFRACTION .2. (ROOT-3X-ROOT-3)R30-DEGREES-XE PD(111) AND THE DILUTE PHASE OF XE PD(111)”, SURFACE SCIENCE, vol. 322, 1995, pp. 207-220.
HILGERS, G., POTTHOFF, M., Müller, N., Heinzmann, U.: STRUCTURE INVESTIGATIONS OF XE-ADSORBATE LAYERS BY SPIN-POLARIZED LOW-ENERGY-ELECTRON DIFFRACTION .2. (ROOT-3X-ROOT-3)R30-DEGREES-XE PD(111) AND THE DILUTE PHASE OF XE PD(111). SURFACE SCIENCE. 322, 207-220 (1995).
HILGERS, G, POTTHOFF, M, Müller, Norbert, and Heinzmann, Ulrich. “STRUCTURE INVESTIGATIONS OF XE-ADSORBATE LAYERS BY SPIN-POLARIZED LOW-ENERGY-ELECTRON DIFFRACTION .2. (ROOT-3X-ROOT-3)R30-DEGREES-XE PD(111) AND THE DILUTE PHASE OF XE PD(111)”. SURFACE SCIENCE 322.1-3 (1995): 207-220.
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