Strong-field multiple ionization of krypton

Maeda H, Dammasch M, Eichmann U, Sandner W, Becker A, Faisal F (2000)
PHYSICAL REVIEW A 62(3).

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Zeitschriftenaufsatz | Veröffentlicht | Englisch
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Abstract / Bemerkung
We have investigated the multiple ion yields of Kr, up to Kr4+ as a function of the field intensity, that are measured using a linearly polarized short-pulsed Ti:sapphire laser of lambda = 800 nm in the range of up to mid-10(15) W/cm(2), within an S-matrix model for nonsequential multiple ionization. Experimental data and theoretical predictions are in good agreement and the influence of different nonsequential channels on the measured ion yields are analyzed.
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Zeitschriftentitel
PHYSICAL REVIEW A
Band
62
Zeitschriftennummer
3
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Maeda H, Dammasch M, Eichmann U, Sandner W, Becker A, Faisal F. Strong-field multiple ionization of krypton. PHYSICAL REVIEW A. 2000;62(3).
Maeda, H., Dammasch, M., Eichmann, U., Sandner, W., Becker, A., & Faisal, F. (2000). Strong-field multiple ionization of krypton. PHYSICAL REVIEW A, 62(3). doi:10.1103/PhysRevA.62.035402
Maeda, H., Dammasch, M., Eichmann, U., Sandner, W., Becker, A., and Faisal, F. (2000). Strong-field multiple ionization of krypton. PHYSICAL REVIEW A 62.
Maeda, H., et al., 2000. Strong-field multiple ionization of krypton. PHYSICAL REVIEW A, 62(3).
H. Maeda, et al., “Strong-field multiple ionization of krypton”, PHYSICAL REVIEW A, vol. 62, 2000.
Maeda, H., Dammasch, M., Eichmann, U., Sandner, W., Becker, A., Faisal, F.: Strong-field multiple ionization of krypton. PHYSICAL REVIEW A. 62, (2000).
Maeda, H, Dammasch, M, Eichmann, U, Sandner, W, Becker, A, and Faisal, Farhard. “Strong-field multiple ionization of krypton”. PHYSICAL REVIEW A 62.3 (2000).