Microcharacterization of the surface oxidation of Py/Cu multilayers by scanning X-ray absorption spectromicroscopy

Kleineberg U, Haindl G, Hütten A, Reiss G, Gullikson EM, Jones MS, Mrowka S, Rekawa SB, Underwood JH (2001)
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING 73(4): 515-519.

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Zeitschriftenaufsatz | Veröffentlicht | Englisch
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Abstract / Bemerkung
The local surface oxidation of the permalloy Surface layer in Py/Cu GMR multilayers on a micron lateral scale has been analyzed by means of a microspot-X-ray absorption spectromicroscope utilizing synchrotron radiation from the Advanced Light Source bending magnet beamline 6.3.2. Additionally, the GMR multilayer samples prepared by do magnetron sputtering have been analyzed by cross-sectional transmission electron microscopy, hard X-ray reflection and magnetoresistance measurements. The formation of a passivating iron-oxide layer on the sample surface was identified by X-ray absorption near edge structure spectroscopy (XANES) near the Fe-2p edge while no indication for nickel-oxide formation could be found. Small micron-size pits of reduced iron-oxide concentration could be identified by XANES microscopy while the corresponding nickel distribution appeared to be homogeneous. The results are explained in terms of a local breakdown of the passivating oxide layer.
Erscheinungsjahr
Zeitschriftentitel
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING
Band
73
Zeitschriftennummer
4
Seite
515-519
ISSN
PUB-ID

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Kleineberg U, Haindl G, Hütten A, et al. Microcharacterization of the surface oxidation of Py/Cu multilayers by scanning X-ray absorption spectromicroscopy. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING. 2001;73(4):515-519.
Kleineberg, U., Haindl, G., Hütten, A., Reiss, G., Gullikson, E. M., Jones, M. S., Mrowka, S., et al. (2001). Microcharacterization of the surface oxidation of Py/Cu multilayers by scanning X-ray absorption spectromicroscopy. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 73(4), 515-519. doi:10.1007/s003390100801
Kleineberg, U., Haindl, G., Hütten, A., Reiss, G., Gullikson, E. M., Jones, M. S., Mrowka, S., Rekawa, S. B., and Underwood, J. H. (2001). Microcharacterization of the surface oxidation of Py/Cu multilayers by scanning X-ray absorption spectromicroscopy. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING 73, 515-519.
Kleineberg, U., et al., 2001. Microcharacterization of the surface oxidation of Py/Cu multilayers by scanning X-ray absorption spectromicroscopy. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 73(4), p 515-519.
U. Kleineberg, et al., “Microcharacterization of the surface oxidation of Py/Cu multilayers by scanning X-ray absorption spectromicroscopy”, APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, vol. 73, 2001, pp. 515-519.
Kleineberg, U., Haindl, G., Hütten, A., Reiss, G., Gullikson, E.M., Jones, M.S., Mrowka, S., Rekawa, S.B., Underwood, J.H.: Microcharacterization of the surface oxidation of Py/Cu multilayers by scanning X-ray absorption spectromicroscopy. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING. 73, 515-519 (2001).
Kleineberg, U, Haindl, G, Hütten, Andreas, Reiss, Günter, Gullikson, EM, Jones, MS, Mrowka, S, Rekawa, SB, and Underwood, JH. “Microcharacterization of the surface oxidation of Py/Cu multilayers by scanning X-ray absorption spectromicroscopy”. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING 73.4 (2001): 515-519.