Electric breakdown in ultrathin MgO tunnel barrier junctions for spin-transfer torque switching

Schäfers M, Drewello V, Reiss G, Thomas A, Thiel K, Eilers G, Muenzenberg M, Schuhmann H, Seibt M (2009)
APPLIED PHYSICS LETTERS 95(23).

Journal Article | Published | English

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Magnetic tunnel junctions for spin-transfer torque (STT) switching are prepared to investigate the dielectric breakdown. Intact and broken tunnel junctions are characterized by transport measurements prior to transmission electron microscopy analysis. The comparison to our previous model for thicker MgO tunnel barriers reveals a different breakdown mechanism arising from the high current densities in a STT device: instead of local pinhole formation at a constant rate, massive electromigration and heating leads to displacement of the junction material and voids are appearing. This is determined by element resolved energy dispersive x-ray spectroscopy and three dimensional tomographic reconstruction. (C) 2009 American Institute of Physics. [doi: 10.1063/1.3272268]
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Schäfers M, Drewello V, Reiss G, et al. Electric breakdown in ultrathin MgO tunnel barrier junctions for spin-transfer torque switching. APPLIED PHYSICS LETTERS. 2009;95(23).
Schäfers, M., Drewello, V., Reiss, G., Thomas, A., Thiel, K., Eilers, G., Muenzenberg, M., et al. (2009). Electric breakdown in ultrathin MgO tunnel barrier junctions for spin-transfer torque switching. APPLIED PHYSICS LETTERS, 95(23).
Schäfers, M., Drewello, V., Reiss, G., Thomas, A., Thiel, K., Eilers, G., Muenzenberg, M., Schuhmann, H., and Seibt, M. (2009). Electric breakdown in ultrathin MgO tunnel barrier junctions for spin-transfer torque switching. APPLIED PHYSICS LETTERS 95.
Schäfers, M., et al., 2009. Electric breakdown in ultrathin MgO tunnel barrier junctions for spin-transfer torque switching. APPLIED PHYSICS LETTERS, 95(23).
M. Schäfers, et al., “Electric breakdown in ultrathin MgO tunnel barrier junctions for spin-transfer torque switching”, APPLIED PHYSICS LETTERS, vol. 95, 2009.
Schäfers, M., Drewello, V., Reiss, G., Thomas, A., Thiel, K., Eilers, G., Muenzenberg, M., Schuhmann, H., Seibt, M.: Electric breakdown in ultrathin MgO tunnel barrier junctions for spin-transfer torque switching. APPLIED PHYSICS LETTERS. 95, (2009).
Schäfers, Markus, Drewello, Volker, Reiss, Günter, Thomas, Andy, Thiel, K., Eilers, G., Muenzenberg, M., Schuhmann, H., and Seibt, M. “Electric breakdown in ultrathin MgO tunnel barrier junctions for spin-transfer torque switching”. APPLIED PHYSICS LETTERS 95.23 (2009).
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