Structural and tunneling properties of magnetic tunnel junctions with Al-O and MgO barrier

Kanak J, Stobiecki T, Thomas A, Schmalhorst J-M, Reiss G (2008)
In: VACUUM. 82. PERGAMON-ELSEVIER SCIENCE LTD: 1057-1061.

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Abstract
Two types of magnetic tunnel junctions (MTJs) with the configuration: substrate Si(1 0 0)/SiO2 47 nm/buffer/IrMn 12 nm/CoFe 2.5 nm/Al-O 1.5 nm/NiFe 3 nm/Ta 5 nm and Si(1 0 0)/SiO2 47 niti/buffer/IrMn 10 nm/CoFeB 3 nm/MgO 2 nm/CoFeB 4 nm/Ta 5 nm were prepared by the sputtering technique with two different buffers: A-Cu 25 nm and B-Ta 5 nm/Cu 25 nm. The B buffer caused a high texture of MTJs whereas in the case of the A buffer junctions texture was weak. Crystallites in the textured layers grew in a columnar like shape that induced interfacial roughness. High textured buffer B caused high interfacial roughness that reduced the resistance-area (RA) product due to a barrier thickness fluctuation. RA also changed substantially depending on the type of a barrier. The highest RA product similar to 15 M Omega mu m(2) was achieved for a low textured junction with Al-O barrier whereas in the high textured MgO sample RA product was similar to 100 k Omega mu m(2). Tunnel magnetoresistance (TMR) measured at room temperature was about 45% for the samples with Al-O barrier, whereas for the samples with MgO barrier TMR was about three times higher and achieved 140%. (C) 2008 Elsevier Ltd. All rights reserved.
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Kanak J, Stobiecki T, Thomas A, Schmalhorst J-M, Reiss G. Structural and tunneling properties of magnetic tunnel junctions with Al-O and MgO barrier. In: VACUUM. Vol 82. PERGAMON-ELSEVIER SCIENCE LTD; 2008: 1057-1061.
Kanak, J., Stobiecki, T., Thomas, A., Schmalhorst, J. - M., & Reiss, G. (2008). Structural and tunneling properties of magnetic tunnel junctions with Al-O and MgO barrier. VACUUM, 82(10), 1057-1061.
Kanak, J., Stobiecki, T., Thomas, A., Schmalhorst, J. - M., and Reiss, G. (2008). “Structural and tunneling properties of magnetic tunnel junctions with Al-O and MgO barrier” in VACUUM, vol. 82, (PERGAMON-ELSEVIER SCIENCE LTD), 1057-1061.
Kanak, J., et al., 2008. Structural and tunneling properties of magnetic tunnel junctions with Al-O and MgO barrier. In VACUUM. no.82 PERGAMON-ELSEVIER SCIENCE LTD, pp. 1057-1061.
J. Kanak, et al., “Structural and tunneling properties of magnetic tunnel junctions with Al-O and MgO barrier”, VACUUM, vol. 82, PERGAMON-ELSEVIER SCIENCE LTD, 2008, pp.1057-1061.
Kanak, J., Stobiecki, T., Thomas, A., Schmalhorst, J.-M., Reiss, G.: Structural and tunneling properties of magnetic tunnel junctions with Al-O and MgO barrier. VACUUM. 82, p. 1057-1061. PERGAMON-ELSEVIER SCIENCE LTD (2008).
Kanak, J., Stobiecki, T., Thomas, Andy, Schmalhorst, Jan-Michael, and Reiss, Günter. “Structural and tunneling properties of magnetic tunnel junctions with Al-O and MgO barrier”. VACUUM. PERGAMON-ELSEVIER SCIENCE LTD, 2008.Vol. 82. 1057-1061.
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