Subdiffraction-resolution fluorescence imaging with conventional fluorescent probes

Heilemann M, van de Linde S, Schüttpelz M, Kasper R, Seefeldt B, Mukherjee A, Tinnefeld P, Sauer M (2008)
ANGEWANDTE CHEMIE-INTERNATIONAL EDITION 47(33): 6172-6176.

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Heilemann M, van de Linde S, Schüttpelz M, et al. Subdiffraction-resolution fluorescence imaging with conventional fluorescent probes. ANGEWANDTE CHEMIE-INTERNATIONAL EDITION. 2008;47(33):6172-6176.
Heilemann, M., van de Linde, S., Schüttpelz, M., Kasper, R., Seefeldt, B., Mukherjee, A., Tinnefeld, P., et al. (2008). Subdiffraction-resolution fluorescence imaging with conventional fluorescent probes. ANGEWANDTE CHEMIE-INTERNATIONAL EDITION, 47(33), 6172-6176. doi:10.1002/anie.200802376
Heilemann, M., van de Linde, S., Schüttpelz, M., Kasper, R., Seefeldt, B., Mukherjee, A., Tinnefeld, P., and Sauer, M. (2008). Subdiffraction-resolution fluorescence imaging with conventional fluorescent probes. ANGEWANDTE CHEMIE-INTERNATIONAL EDITION 47, 6172-6176.
Heilemann, M., et al., 2008. Subdiffraction-resolution fluorescence imaging with conventional fluorescent probes. ANGEWANDTE CHEMIE-INTERNATIONAL EDITION, 47(33), p 6172-6176.
M. Heilemann, et al., “Subdiffraction-resolution fluorescence imaging with conventional fluorescent probes”, ANGEWANDTE CHEMIE-INTERNATIONAL EDITION, vol. 47, 2008, pp. 6172-6176.
Heilemann, M., van de Linde, S., Schüttpelz, M., Kasper, R., Seefeldt, B., Mukherjee, A., Tinnefeld, P., Sauer, M.: Subdiffraction-resolution fluorescence imaging with conventional fluorescent probes. ANGEWANDTE CHEMIE-INTERNATIONAL EDITION. 47, 6172-6176 (2008).
Heilemann, Mike, van de Linde, Sebastian, Schüttpelz, Mark, Kasper, Robert, Seefeldt, Britta, Mukherjee, Anindita, Tinnefeld, Philip, and Sauer, Markus. “Subdiffraction-resolution fluorescence imaging with conventional fluorescent probes”. ANGEWANDTE CHEMIE-INTERNATIONAL EDITION 47.33 (2008): 6172-6176.
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