7 Publikationen
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2021 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2949960Quantitative comparison of the magnetic proximity effect in Pt detected by XRMR and XMCDPUB | DOI | Download (ext.) | WoS
Graulich, Dominik, Quantitative comparison of the magnetic proximity effect in Pt detected by XRMR and XMCD. Applied Physics Letters 118 (1). , 2021 -
2021 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2953403Erratum: Quantitative comparison of the magnetic proximity effect in Pt detected by XRMR and XMCD (vol 118, 012407, 2021)PUB | DOI | WoS
Graulich, Dominik, Erratum: Quantitative comparison of the magnetic proximity effect in Pt detected by XRMR and XMCD (vol 118, 012407, 2021). Applied Physics Letters 118 (8). , 2021 -
2021 | Bielefelder E-Dissertation | PUB-ID: 2959924Development and optimization of ultrasensitive magnetoresistive sensorsPUB | PDF
Moskaltsova, Anastasiia, Development and optimization of ultrasensitive magnetoresistive sensors. (). Bielefeld, 2021 -
2021 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2957078Current trends in planar Hall effect sensors: evolution, optimization, and applicationsPUB | DOI | WoS
Elzwawy, Amir, Current trends in planar Hall effect sensors: evolution, optimization, and applications. Journal of Physics D: Applied Physics 54 (35). , 2021 -
2020 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2940692Impact of the magnetic proximity effect in Pt on the total magnetic moment of Pt/Co/Ta trilayers studied by x-ray resonant magnetic reflectivityPUB | DOI | Download (ext.) | WoS | arXiv
Moskaltsova, Anastasiia, Impact of the magnetic proximity effect in Pt on the total magnetic moment of Pt/Co/Ta trilayers studied by x-ray resonant magnetic reflectivity. AIP Advances 10 (1). , 2020 -
2020 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2943465Advanced data analysis procedure for hard x-ray resonant magnetic reflectivity discussed for Pt thin film samples of various complexityPUB | PDF | DOI | Download (ext.) | WoS
Krieft, Jan, Advanced data analysis procedure for hard x-ray resonant magnetic reflectivity discussed for Pt thin film samples of various complexity. Journal of Physics D: Applied Physics 53 (). , 2020 -
2018 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2921242Multilevel process on large area wafers for nanoscale devicesPUB | DOI | WoS
Pires, B. J., Multilevel process on large area wafers for nanoscale devices. JOURNAL OF MANUFACTURING PROCESSES 32 (). , 2018