7 Publikationen
-
2021 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2949960Graulich, D., Krieft, J., Moskaltsova, A., Demir, J., Peters, T., Pohlmann, T., Bertram, F., Wollschläger, J., L. Mardegan, J. R., Francoual, S., et al. (2021). Quantitative comparison of the magnetic proximity effect in Pt detected by XRMR and XMCD. Applied Physics Letters 118:012407.PUB | DOI | Download (ext.) | WoS
-
2021 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2953403Graulich, D., Krieft, J., Moskaltsova, A., Demir, J., Peters, T., Pohlmann, T., Bertram, F., Wollschlaeger, J., Mardegan, J. R. L., Francoual, S., et al. (2021). Erratum: Quantitative comparison of the magnetic proximity effect in Pt detected by XRMR and XMCD (vol 118, 012407, 2021). Applied Physics Letters 118:089901.PUB | DOI | WoS
-
-
2021 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2957078Elzwawy, A., Piskin, H., Akdogan, N., Volmer, M., Reiss, G., Marnitz, L., Moskaltsova, A., Gurel, O., and Schmalhorst, J. - M. (2021). Current trends in planar Hall effect sensors: evolution, optimization, and applications. Journal of Physics D: Applied Physics 54:353002.PUB | DOI | WoS
-
2020 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2940692Moskaltsova, A., Krieft, J., Graulich, D., Matalla-Wagner, T., and Kuschel, T. (2020). Impact of the magnetic proximity effect in Pt on the total magnetic moment of Pt/Co/Ta trilayers studied by x-ray resonant magnetic reflectivity. AIP Advances 10:015154.PUB | DOI | Download (ext.) | WoS | arXiv
-
2020 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2943465Krieft, J., Graulich, D., Moskaltsova, A., Bouchenoire, L., Francoual, S., and Kuschel, T. (2020). Advanced data analysis procedure for hard x-ray resonant magnetic reflectivity discussed for Pt thin film samples of various complexity. Journal of Physics D: Applied Physics 53:375004.PUB | PDF | DOI | Download (ext.) | WoS
-
2018 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2921242Pires, B. J., Silva, A. V., Moskaltsova, A., Deepak, F. L., Brogueira, P., Leitao, D. C., and Cardoso, S. (2018). Multilevel process on large area wafers for nanoscale devices. JOURNAL OF MANUFACTURING PROCESSES 32, 222-229.PUB | DOI | WoS