7 Publikationen
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2021 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2949960Graulich, D., Krieft, J., Moskaltsova, A., Demir, J., Peters, T., Pohlmann, T., Bertram, F., et al. (2021). Quantitative comparison of the magnetic proximity effect in Pt detected by XRMR and XMCD. Applied Physics Letters, 118(1), 012407. https://doi.org/10.1063/5.0032584PUB | DOI | Download (ext.) | WoS
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2021 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2953403Graulich, D., Krieft, J., Moskaltsova, A., Demir, J., Peters, T., Pohlmann, T., Bertram, F., et al. (2021). Erratum: Quantitative comparison of the magnetic proximity effect in Pt detected by XRMR and XMCD (vol 118, 012407, 2021). Applied Physics Letters, 118(8), 089901. https://doi.org/10.1063/5.0045052PUB | DOI | WoS
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2021 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2957078Elzwawy, A., Piskin, H., Akdogan, N., Volmer, M., Reiss, G., Marnitz, L., Moskaltsova, A., et al. (2021). Current trends in planar Hall effect sensors: evolution, optimization, and applications. Journal of Physics D: Applied Physics , 54(35), 353002. https://doi.org/10.1088/1361-6463/abfbfbPUB | DOI | WoS
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2020 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2940692Moskaltsova, A., Krieft, J., Graulich, D., Matalla-Wagner, T., & Kuschel, T. (2020). Impact of the magnetic proximity effect in Pt on the total magnetic moment of Pt/Co/Ta trilayers studied by x-ray resonant magnetic reflectivity. AIP Advances, 10(1), 015154. https://doi.org/10.1063/1.5130031PUB | DOI | Download (ext.) | WoS | arXiv
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2020 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2943465Krieft, J., Graulich, D., Moskaltsova, A., Bouchenoire, L., Francoual, S., & Kuschel, T. (2020). Advanced data analysis procedure for hard x-ray resonant magnetic reflectivity discussed for Pt thin film samples of various complexity. Journal of Physics D: Applied Physics, 53, 375004. https://doi.org/10.1088/1361-6463/ab8fdcPUB | PDF | DOI | Download (ext.) | WoS
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2018 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2921242Pires, B. J., Silva, A. V., Moskaltsova, A., Deepak, F. L., Brogueira, P., Leitao, D. C., & Cardoso, S. (2018). Multilevel process on large area wafers for nanoscale devices. JOURNAL OF MANUFACTURING PROCESSES, 32, 222-229. doi:10.1016/j.jmapro.2018.01.024PUB | DOI | WoS