Wiebke Hachmann
PEVZ-ID
13 Publikationen
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2008 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2315310A. Sischka, et al., “Single Beam Optical Tweezers Setup with Backscattered Light Detection for 3D Measurements on DNA and Nanopores”, Review of Scientific Instruments, vol. 79, 2008, pp. 063702.PUB | DOI | WoS | PubMed | Europe PMC
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2006 | Sammelwerksbeitrag | Veröffentlicht | PUB-ID: 1874432A. Wonisch, et al., “Plasma Assisted Deposition of Tungsten Oxide / Silicon Oxide Multilayer Films with Sub-Nanometer Single Layers”, Functional Properties of Nanostructured Materials, R. Kassing, et al., eds., Dordrecht: Springer, 2006, pp.351-354.PUB | DOI
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2005 | Sammelwerksbeitrag | PUB-ID: 1874434T. Ivanova, et al., “Plasma enhanced MOCVD of transition metal oxide thin films with a thickness between some hundred and less than one nanometer for optical applications”, ECS Proceedings; PV 2005-09, 2005, pp.433-433.PUB
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2004 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1606660A. Hütten, et al., “New magnetic nanoparticles for biotechnology”, JOURNAL OF BIOTECHNOLOGY, vol. 112, 2004, pp. 47-63.PUB | DOI | WoS | PubMed | Europe PMC
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2003 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1875368D. Sudfeld, et al., “Analysis of Monodispersed FeCo Nanoparticles by High-Resolution Transmission Electron Microscopy”, Microscopy and Microanalysis, vol. 9, 2003, pp. 196-197.PUB
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2003 | Konferenzbeitrag | Veröffentlicht | PUB-ID: 1611059U. Kleineberg, et al., “Effect of substrate roughness on Mo/Si multilayer optics for EUVL produced by UHV-e-beam evaporation and ion polishing”, Thin Solid Films, THIN SOLID FILMS, vol. 433, ELSEVIER SCIENCE SA, 2003, pp.230-236.PUB | DOI | WoS
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