Wiebke Hachmann
PEVZ-ID
13 Publikationen
-
-
-
-
2008 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2315310Sischka A, Kleimann C, Hachmann W, et al. Single Beam Optical Tweezers Setup with Backscattered Light Detection for 3D Measurements on DNA and Nanopores. Review of Scientific Instruments. 2008;79(6):063702.PUB | DOI | WoS | PubMed | Europe PMC
-
2006 | Sammelwerksbeitrag | Veröffentlicht | PUB-ID: 1874432Wonisch A, Hamelmann F, Hachmann W, Heinzmann U. Plasma Assisted Deposition of Tungsten Oxide / Silicon Oxide Multilayer Films with Sub-Nanometer Single Layers. In: Kassing R, Petkov P, Kulisch W, Popov C, eds. Functional Properties of Nanostructured Materials. Dordrecht: Springer; 2006: 351-354.PUB | DOI
-
2005 | Sammelwerksbeitrag | PUB-ID: 1874434Ivanova T, Gesheva K, Hamelmann F, Hachmann W, Heinzmann U, Brechling A. Plasma enhanced MOCVD of transition metal oxide thin films with a thickness between some hundred and less than one nanometer for optical applications. In: ECS Proceedings; PV 2005-09. 2005: 433-433.PUB
-
2004 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1876164Wonisch A, Westerwalbesloh T, Hachmann W, Kabachnik NM, Kleineberg U, Heinzmann U. Aperiodic nanometer multilayer systems as optical key components for attosecond electron spectroscopy. Thin Solid Films 464-465. 2004;464-465:473-477.PUB | DOI | WoS
-
2004 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1606660Hütten A, Sudfeld D, Ennen I, et al. New magnetic nanoparticles for biotechnology. JOURNAL OF BIOTECHNOLOGY. 2004;112(1-2):47-63.PUB | DOI | WoS | PubMed | Europe PMC
-
2003 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1875368Sudfeld D, Ennen I, Hachmann W, et al. Analysis of Monodispersed FeCo Nanoparticles by High-Resolution Transmission Electron Microscopy. Microscopy and Microanalysis. 2003;9(S03):196-197.PUB
-
2003 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1610694Aschentrup A, Hachmann W, Westerwalbesloh T, Lim YC, Kleineberg U, Heinzmann U. Determination of layer-thickness fluctuations in Mo/Si multilayers by cross-sectional HR-TEM and X-ray diffraction. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING. 2003;77(5):607-611.PUB | DOI | WoS
-
2003 | Konferenzbeitrag | Veröffentlicht | PUB-ID: 1611059Kleineberg U, Westerwalbesloh T, Hachmann W, et al. Effect of substrate roughness on Mo/Si multilayer optics for EUVL produced by UHV-e-beam evaporation and ion polishing. In: Thin Solid Films. THIN SOLID FILMS. Vol 433. ELSEVIER SCIENCE SA; 2003: 230-236.PUB | DOI | WoS
-
2003 | Konferenzbeitrag | Veröffentlicht | PUB-ID: 1611745Sudfeld D, Wojczykowski K, Hachmann W, Jutzi P, Reiss G, Hütten A. Tailoring magnetic nanocrystal superlattices by chemical engineering. In: Journal of Applied Physics. Journal of Applied Physics. Vol 93. AMER INST PHYSICS; 2003: 7328-7330.PUB | DOI | WoS
-
2002 | Konferenzbeitrag | Veröffentlicht | PUB-ID: 1613339Sudfeld D, Wojczykowski K, Hachmann W, et al. Magnetic cobalt nanocrystals organized in patches and chains. In: IEEE Transactions on Magnetics. IEEE TRANSACTIONS ON MAGNETICS. Vol 38. IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC; 2002: 2601-2603.PUB | DOI | WoS