10 Publikationen
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2020 | Zeitschriftenaufsatz | E-Veröff. vor dem Druck | PUB-ID: 2944327A. Panda, A. Yadav, H. Yeerna, A. Singh, M. Biehl, M. Lux, A. Schulz, T. Klecha, S. Doniach, H. Khiabanian, et al., “Tissue- and development-stage-specific mRNA and heterogeneous CNV signatures of human ribosomal proteins in normal and cancer samples.”, Nucleic acids research, 2020.PUB | DOI | WoS | PubMed | Europe PMC
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2018 | Zeitschriftenaufsatz | E-Veröff. vor dem Druck | PUB-ID: 2917896M. Lux, R. R. Brinkman, C. Chauve, A. Laing, A. Lorenc, L. Abeler-Dörner, and B. Hammer, “flowLearn: Fast and precise identification and quality checking of cell populations in flow cytometry”, Bioinformatics, 2018, 34, 2245-2253.PUB | DOI | WoS | PubMed | Europe PMC
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2016 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2907633M. Lux, J. Krüger, C. Rinke, I. Maus, A. Schlüter, T. Woyke, A. Sczyrba, and B. Hammer, “acdc – Automated Contamination Detection and Confidence estimation for single-cell genome data”, BMC Bioinformatics, 2016, 17, : 543.PUB | PDF | DOI | WoS | PubMed | Europe PMC
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2016 | Datenpublikation | PUB-ID: 2904577M. Lux, Acdc evaluation data , Bielefeld University, 2016.PUB | Dateien verfügbar | DOI
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2015 | Preprint | Veröffentlicht | PUB-ID: 2901613M. Lux, B. Hammer, and A. Sczyrba, “Automated Contamination Detection in Single-Cell Sequencing”, bioRxiv, 2015.PUB
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2012 | Konferenzbeitrag | Veröffentlicht | PUB-ID: 2536426B. Mokbel, S. Gross, M. Lux, N. Pinkwart, and B. Hammer, in Artificial Neural Networks in Pattern Recognition. 5th INNS IAPR TC 3 GIRPR Workshop, ANNPR 2012. Proceedings (Eds.: N. Mana, F. Schwenker, E. Trentin), Springer Berlin Heidelberg, 2012, p. 1-13.PUB | PDF | DOI
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2011 | Konferenzbeitrag | Veröffentlicht | PUB-ID: 2901616M. Lux, J. Laußmann, A. Mehler, and C. Menßen, in 2011 IEEE/WIC/ACM International Conferences on Web Intelligence and Intelligent Agent Technology (Eds.: Association for Computing Machinery, IEEE Computer Society, Institute of Electrical and Electronics Engineers, Web Intelligence Consortium), Institute Of Electrical & Electronics Engineers (Ieee), Piscataway, NJ, 2011.PUB | DOI