Frank Hamelmann
PEVZ-ID
30 Publikationen
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2006 | Sammelwerksbeitrag | Veröffentlicht | PUB-ID: 1874432A. Wonisch, et al., “Plasma Assisted Deposition of Tungsten Oxide / Silicon Oxide Multilayer Films with Sub-Nanometer Single Layers”, Functional Properties of Nanostructured Materials, R. Kassing, et al., eds., Dordrecht: Springer, 2006, pp.351-354.PUB | DOI
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2005 | Konferenzbeitrag | Veröffentlicht | PUB-ID: 1874437K. Gesheva, et al., “Technology and characterization of CVD-grown mixed Mo/W oxide films and electrochromic devices made on their basis”, ECS Proceedings PV 2005-09, 2005, pp.799-799.PUB
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2005 | Sammelwerksbeitrag | PUB-ID: 1874434T. Ivanova, et al., “Plasma enhanced MOCVD of transition metal oxide thin films with a thickness between some hundred and less than one nanometer for optical applications”, ECS Proceedings; PV 2005-09, 2005, pp.433-433.PUB
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2003 | Sammelwerksbeitrag | PUB-ID: 1882887F. Hamelmann, et al., “Thin Tungsten and Tungsten Oxide Films Produced by Tungsten Pentacarbonoyle Pentylisonitrile in a Remote Plasma Reactor”, Chemical Vapor Deposition CVD XVI ECS Proceedings, M. Allendorf, F. Maury, and F. Teyssandier, eds., 2003.PUB
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2000 | Sammelwerksbeitrag | Veröffentlicht | PUB-ID: 1883586A. Klipp, et al., “The synthesis of Cyclopentadienyl silanes and disilanes and their fragmentation under thermal CVD conditions”, Organosilicon Chemistry from Molecules to Materials IV, eds. N.Auner,J.Weis, N. Auer and J. Weis, eds., VCH Weinheim: VCH, 2000, pp.806-806.PUB
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2000 | Dissertation | PUB-ID: 2433882F. Hamelmann, Herstellung von Metall-Silizium-Multischichten mit dem MOCVD-Verfahren, Berichte aus der Physik, Aachen: Shaker, 2000.PUB
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2000 | Konferenzbeitrag | Veröffentlicht | PUB-ID: 1958189F. Hamelmann, et al., “Plasma enhanced MOCVD of smooth nanometer-sized Metal/Silicon Single- and multilayer films”, Chemical Vapor Deposition CVD XV, ECS Proc. PV, M.D. Allendorf and T.M. Besman, eds., 2000, pp.131.PUB
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2000 | Konferenzbeitrag | Veröffentlicht | PUB-ID: 1883600F. Hamelmann, et al., “In situ controlled deposition of thin silicon films by hot filament MOCVD with (C5Me5) Si2H5 and (C5Me4H)SiH3 as silicon precursors”, Organosilicon Chemistry IV: from Molecules to Materials, N. Auer and J. Weis, eds., Weinheim: Wiley-VCH, 2000, pp.798-798.PUB
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1999 | Konferenzbeitrag | Veröffentlicht | PUB-ID: 1622647U. Kleineberg, et al., “Photoemission microscopy with microspot-XPS by use of undulator radiation and a high-throughput multilayer monochromator at BESSY”, Journal of Electron Spectroscopy and Related Phenomena, JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, vol. 103, ELSEVIER SCIENCE BV, 1999, pp.931-936.PUB | DOI | WoS
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1999 | Zeitschriftenaufsatz | PUB-ID: 1883592F. Hamelmann, et al., “Metal/Silicon multilayers produced by low temperature MOCVD”, Mater.Res.Soc.Proc., vol. 555, 1999, pp. 19-19.PUB
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1998 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1624974H.J. Stock, et al., “Carbon/titanium multilayers as soft-x-ray mirrors for the water window”, APPLIED OPTICS, vol. 37, 1998, pp. 6002-6005.PUB | DOI | WoS | PubMed | Europe PMC
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1997 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1637796H.J. Stock, et al., “Carbon buffer layers for smoothing superpolished glass surfaces as substrates for molybdenum/silicon multilayer soft-x-ray mirrors”, APPLIED OPTICS, vol. 36, 1997, pp. 1650-1654.PUB | DOI | WoS | PubMed | Europe PMC
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