Frank Hamelmann
PEVZ-ID
30 Publikationen
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2006 | Sammelwerksbeitrag | Veröffentlicht | PUB-ID: 1874432Wonisch, A., et al., 2006. Plasma Assisted Deposition of Tungsten Oxide / Silicon Oxide Multilayer Films with Sub-Nanometer Single Layers. In R. Kassing, et al., eds. Functional Properties of Nanostructured Materials. Dordrecht: Springer, pp. 351-354.PUB | DOI
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2005 | Konferenzbeitrag | Veröffentlicht | PUB-ID: 1874437Gesheva, K., et al., 2005. Technology and characterization of CVD-grown mixed Mo/W oxide films and electrochromic devices made on their basis. In ECS Proceedings PV 2005-09. pp. 799-799.PUB
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2005 | Sammelwerksbeitrag | PUB-ID: 1874434Ivanova, T., et al., 2005. Plasma enhanced MOCVD of transition metal oxide thin films with a thickness between some hundred and less than one nanometer for optical applications. In ECS Proceedings; PV 2005-09. pp. 433-433.PUB
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2003 | Sammelwerksbeitrag | PUB-ID: 1882887Hamelmann, F., et al., 2003. Thin Tungsten and Tungsten Oxide Films Produced by Tungsten Pentacarbonoyle Pentylisonitrile in a Remote Plasma Reactor. In M. Allendorf, F. Maury, & F. Teyssandier, eds. Chemical Vapor Deposition CVD XVI ECS Proceedings.PUB
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2000 | Sammelwerksbeitrag | Veröffentlicht | PUB-ID: 1883586Klipp, A., et al., 2000. The synthesis of Cyclopentadienyl silanes and disilanes and their fragmentation under thermal CVD conditions. In N. Auer & J. Weis, eds. Organosilicon Chemistry from Molecules to Materials IV, eds. N.Auner,J.Weis. VCH Weinheim: VCH, pp. 806-806.PUB
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2000 | Dissertation | PUB-ID: 2433882Hamelmann, F., 2000. Herstellung von Metall-Silizium-Multischichten mit dem MOCVD-Verfahren, Berichte aus der Physik, Aachen: Shaker.PUB
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2000 | Konferenzbeitrag | Veröffentlicht | PUB-ID: 1958189Hamelmann, F., et al., 2000. Plasma enhanced MOCVD of smooth nanometer-sized Metal/Silicon Single- and multilayer films. In M. D. Allendorf & T. M. Besman, eds. Chemical Vapor Deposition CVD XV, ECS Proc. PV. pp. 131.PUB
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2000 | Konferenzbeitrag | Veröffentlicht | PUB-ID: 1883600Hamelmann, F., et al., 2000. In situ controlled deposition of thin silicon films by hot filament MOCVD with (C5Me5) Si2H5 and (C5Me4H)SiH3 as silicon precursors. In N. Auer & J. Weis, eds. Organosilicon Chemistry IV: from Molecules to Materials. Weinheim: Wiley-VCH, pp. 798-798.PUB
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1999 | Konferenzbeitrag | Veröffentlicht | PUB-ID: 1622647Kleineberg, U., et al., 1999. Photoemission microscopy with microspot-XPS by use of undulator radiation and a high-throughput multilayer monochromator at BESSY. In Journal of Electron Spectroscopy and Related Phenomena. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA. no.103 ELSEVIER SCIENCE BV, pp. 931-936.PUB | DOI | WoS
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1999 | Zeitschriftenaufsatz | PUB-ID: 1883592Hamelmann, F., et al., 1999. Metal/Silicon multilayers produced by low temperature MOCVD. Mater.Res.Soc.Proc., 555, p 19-19.PUB
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1998 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1624974Stock, H.J., et al., 1998. Carbon/titanium multilayers as soft-x-ray mirrors for the water window. APPLIED OPTICS, 37(25), p 6002-6005.PUB | DOI | WoS | PubMed | Europe PMC
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1997 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1637796Stock, H.J., et al., 1997. Carbon buffer layers for smoothing superpolished glass surfaces as substrates for molybdenum/silicon multilayer soft-x-ray mirrors. APPLIED OPTICS, 36(7), p 1650-1654.PUB | DOI | WoS | PubMed | Europe PMC
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