7 Publikationen

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  • [7]
    2012 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2523840
    Jiang, Y., et al., 2012. Abnormal behaviors in electrical transport properties of cobalt-doped tin oxide thin films. Journal of Materials Chemistry, 22(31), p 16060-16065.
    PUB | DOI | WoS
     
  • [6]
    2011 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2289502
    Jiang, Y., et al., 2011. Application of n-(Bu2)Sn(acac)2 for the deposition of nanocrystallite SnO2 films: Nucleation, growth and physical properties. JOURNAL OF ALLOYS AND COMPOUNDS, 509(29), p 7798-7802.
    PUB | DOI | WoS
     
  • [5]
    2011 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 2093638
    Jiang, Y., et al., 2011. Unusual enhancement in electrical conductivity of tin oxide thin films with zinc doping. PHYSICAL CHEMISTRY CHEMICAL PHYSICS, 13(13), p 5760-5763.
    PUB | DOI | WoS | PubMed | Europe PMC
     
  • [4]
    2010 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1796464
    Jiang, Y., & Bahlawane, N., 2010. Effect of Nucleation and Growth Kinetics on the Electrical and Optical Properties of Undoped ZnO Films. JOURNAL OF PHYSICAL CHEMISTRY C, 114(11), p 5121-5125.
    PUB | DOI | WoS
     
  • [3]
    2010 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1968232
    Jiang, Y., & Bahlawane, N., 2010. The growth of nanoscale ZnO films by pulsed-spray evaporation chemical vapor deposition and their structural, electric and optical properties. Thin Solid Films, 519(1), p 284-288.
    PUB | DOI | WoS
     
  • [2]
    2009 | Zeitschriftenaufsatz | PUB-ID: 2325435
    Jiang, Y., & Bahlawane, N., 2009. Investigation of growth, structure and optical properties of CeO2 nanocrystalline thin films prepared by pulsed spray evaporation chemical vapor deposition (PSE-CVD). NANOSCIENCE AND NANOTECHNOLOGY LETTERS, 1(2), p 134-139.
    PUB | DOI | WoS
     
  • [1]
    2009 | Zeitschriftenaufsatz | Veröffentlicht | PUB-ID: 1589716
    Jiang, Y., & Bahlawane, N., 2009. Changes in the structural and optical properties of CeO2 nanocrystalline films: Effect of film thickness. JOURNAL OF ALLOYS AND COMPOUNDS, 485(1-2), p L52-L55.
    PUB | DOI | WoS
     

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